Recessed PELCO SEMClamp™ 25 x 15mm 5TTHX Each probe comes with a

Each probe comes with a high-resolution SEM image showing the precise tip shape

Calibration artifact: 180nm step height

which means that calibration and measurements are faster

Tip measurements are listed below

Recessed PELCO SEMClamp™ 25 x 15mm 5TTHX Each probe comes with aDESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3. 2mm (1 8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain