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low thermal linear expansion coefficient
Ø38mm x 6mm pin height
bent at 45 degrees 5/45 105mm NM-SS 0
Other applications of the DDESP-V2 probe include: Scanning Capacitance Microscopy (SCM)
All-In-One-DD SEM Magnification Standard and Stage Micrometer MRS-4 low thermal linear expansion coefficientDiamond Coated, Conductive AFM Probe with 4 Different Cantilevers DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Diamond Coated, Conductive AFM Probe with 4 Different Cantilevers Versatile monolithic silicon AFM probe with 4 different cantilevers on a single AFM holder chip for various applications: contact mode, force modulation mode, soft tapping mode and high frequency tapping non contact mode and electric modes such as: scanning
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